Atomic Force Microscopy (AFM) provides images with near-atomic resolution to study the surface structure of solid materials including insulators. It is mainly used to measure the surface morphology, conductivity, surface potential, electric field, magnetic domain, friction, viscoelasticity, adhesion, I/V curve, modulus, dopant distribution and other surface properties of substances.
STEMart conducts atomic force microscopy analysis to measure surface topography of various materials, including polymers, ceramics, composites, glass, and biological samples.
There are no reviews for this Publication.
There are no comments for this Publication.
You must log in to post a comment.
Log in
